MIPS Products

SOC-it® L2 Cache Controller

With time-to-market pressures mounting for complex 90nm and 65nm SoC designs, MIPS Technologies, Inc. has developed a platform strategy for its entire range of MIPS® processors. The fully verified SOC-it® Platform and supporting environments will ease the design of high-performance MIPS-Based™ SoCs, lowering costs, accelerating time-to-market and reducing development risk.

The first component of the SOC-it Platform is the SOC-it® L2 Cache Controller, an efficient L2 subsystem. Fully synthesizable and highly portable across processes, the SOC-it L2 Cache Controller works seamlessly with all MIPS Technologies OCP-based cores and uses standard cell libraries and memory arrays. The SOC-it L2 Cache Controller reduces system costs, lowers power consumption and boosts performance by up to 100%.






  • Inline OCP device
  • Unified cache (I and D combined)
  • 32-byte cache line sizeo 8-Way set associative
  • Pseudo-LRU replacement algorithm
  • Selectable I/O clock ratios
  • Support for dual-use as SRAM


Features

  • 7-stage pipeline to achieve high frequencies with low power
  • Programmable cache sizes
    • 128, 256, 512 or 1024 KBytes
  • Up to 12 outstanding read misses, with hit under miss
  • Write-back and write-through support
  • Physically indexed, physically tagged
  • Cache line locking support
  • Optional ECC support for resilience to soft errors
    • Single bit error correction and 2 bit error detection support for Tag and Data arrays
    • ingle bit detection only for WS array
  • OCP master and slave interfaces
    • Compliant to OCP version 2.1
  • Bypass mode
  • Optional system memory support
  • Unified level 2 cache holds instruction and data references
  • Power control
    • Minimum frequency: 0 MHz
    • Sleep mode
    • Support for extensive use of fine-grained clock gating
  • Easy integration
    • Fully synthesizable RTL
    • Single-port synchronous SRAMs for tag, data and way-select arrays
    • Support for optional pipelined SRAMs for data array
  • Testability
    • Full scan design achieves test coverage in excess of 99% (dependent on library and configuration options)
    • Optional memory BIST for internal SRAM arrays, with support for integrated (March C+, IFA-13) or custom BIST controller


Specifications

Gate Count220K gates (area optimized)
TechnologyTSMC 90G
Cache Size256 KB
Speed Target400 MHz
Total Area5.2mm2
Core1.2mm2
Arrays4.0mm2


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